三次元測定機、形状測定装置

Zeiss Rondcom 54

ZEISS Rondcom 54 Form Measuring Instrument – Surface and Contour Measuring Device

Max. Measuring Diameter (OD): approx. 300 mm
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Max. Workpiece Diameter: approx. 580 mm (depending on configuration)
Max. Workpiece Load: approx. 30 kg
Rotational Axis (C-axis) – Radial Roundness: 0.020 + 6 H / 10,000 µm (tolerance)
Axial Runout: 0.020 + 4 R / 10,000 µm
Measuring Speed (Rotation): approx. 2 – 10 rpm
Centering Range: ± 2 mm
Leveling / Tilting Range: ± 1°
Resolution (Rotary Axis): 0.025°
Z-Axis (Vertical Travel): 300 mm (optionally expandable to 500 mm)
Straightness Deviation Z-Axis: 0.12 µm / 100 mm, 0.20 µm / 300 mm
Parallelism Deviation (relative to rotary axis): 0.8 µm / 300 mm
R-Axis (Radial Movement) – Travel: 170 mm
Straightness Deviation R-Axis: 0.8 µm / 150 mm
Parallelism Deviation (C vs. R): 1 µm / 150 mm
Linear Scale (on R-Axis): Yes, available as standard (for higher accuracy)
Measuring Force (stylus / probe): adjustable, 30 – 100 mN
Measuring Range (probe): ± 1000 µm (adjustable)
Detector Resolution: up to 0.001 µm (1 nm)
Standard Stylus: Length L = 54 mm, Ball Ø = 1.6 mm carbide
Power Supply: 100 – 240 V AC, 50/60 Hz
Power Consumption: approx. 600 VA
Compressed Air Requirement: 0.3 – 0.7 MPa
Weight (approx.): approx. 170 kg



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