計測システムMahr
XR1+SD26+ST-G
計測システム
Mahr
XR1+SD26+ST-G
EXW 固定価格 消費税別
€5,404
製造年
2015
状態
中古
所在地
Iași 

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機械に関するデータ
価格と所在地
EXW 固定価格 消費税別
€5,404
- 所在地:
- Calea Chisinaului Nr. 132, C4 building, C1-parter, 1 floor, C2-parter, et.1, 700178 Iași, România

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オファーの詳細
- 広告ID:
- A20575115
- 更新:
- 最終更新日:21.11.2025
説明
Technical characteristics:
System Components
- XR1 Evaluation Unit: PC-based system with MarWin software
- SD26 Drive Unit: Skidless tracing system with motorized height adjustment
- ST-G Measuring Stand: Granite base (500 × 300 mm) with manual column adjustment
Measurement Capabilities
- Tracing length: 1.75 mm, 5.6 mm, 17.5 mm (DIN/ISO); 1–16 mm (ISO 12085)
- Tracing speed: 0.2 mm/s or 1 mm/s
- Positioning speed (X-axis): 5 mm/s
- Height adjustment (Z-axis): 7.5 mm motorized
- Positioning speed (Z-axis): 2 mm/s
- Measuring range: ±250 µm (±500 µm with extended probe arm)
- Probe force: ~0.7 mN
Probe System: BFW 250 (skidless, magnetic mount for fast change)
Software & Evaluation
- Supported parameters: R, P, W, Motif, D profiles
- Standards: ISO, JIS, MOTIF (ISO 12085)
- Features:
- Over 80 surface parameters
- Automatic cutoff and measuring path selection
- Quick & easy measuring programs
Kdjdpoxx R Rnjfx Afnow
- PDF report generation
- ASCII export and USB data transfer
- Multi-user levels and calibration reminders
Hardware & Interface
- PC: All-in-one or industrial PC (optional)
- Connectivity: USB and Bluetooth (for drive unit)
- Display: Touchscreen interface with intuitive icons
Accessories:
- CT 120 cross table
- Calibration set
- Magnetic probe arm holder
- Optional contour evaluation module
Machine status:
WORKING
この広告は自動翻訳されています。翻訳ミスがある可能性があります。
System Components
- XR1 Evaluation Unit: PC-based system with MarWin software
- SD26 Drive Unit: Skidless tracing system with motorized height adjustment
- ST-G Measuring Stand: Granite base (500 × 300 mm) with manual column adjustment
Measurement Capabilities
- Tracing length: 1.75 mm, 5.6 mm, 17.5 mm (DIN/ISO); 1–16 mm (ISO 12085)
- Tracing speed: 0.2 mm/s or 1 mm/s
- Positioning speed (X-axis): 5 mm/s
- Height adjustment (Z-axis): 7.5 mm motorized
- Positioning speed (Z-axis): 2 mm/s
- Measuring range: ±250 µm (±500 µm with extended probe arm)
- Probe force: ~0.7 mN
Probe System: BFW 250 (skidless, magnetic mount for fast change)
Software & Evaluation
- Supported parameters: R, P, W, Motif, D profiles
- Standards: ISO, JIS, MOTIF (ISO 12085)
- Features:
- Over 80 surface parameters
- Automatic cutoff and measuring path selection
- Quick & easy measuring programs
Kdjdpoxx R Rnjfx Afnow
- PDF report generation
- ASCII export and USB data transfer
- Multi-user levels and calibration reminders
Hardware & Interface
- PC: All-in-one or industrial PC (optional)
- Connectivity: USB and Bluetooth (for drive unit)
- Display: Touchscreen interface with intuitive icons
Accessories:
- CT 120 cross table
- Calibration set
- Magnetic probe arm holder
- Optional contour evaluation module
Machine status:
WORKING
この広告は自動翻訳されています。翻訳ミスがある可能性があります。
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