三次元測定機Zeiss
O-Inspect O-I 442
三次元測定機
Zeiss
O-Inspect O-I 442
製造年
2008
状態
中古
(完全に稼働しています)
所在地
Sonthofen 

機械に関するデータ
価格と所在地
- 所在地:
- Sonthofen, ドイツ

電話する
技術詳細
- X軸測定範囲:
- 400 mm
- Y軸測定範囲:
- 400 mm
- Z軸測定範囲:
- 200 mm
- 装備:
- 銘板あり
オファーの詳細
- 広告ID:
- A22208667
- 更新:
- 最終更新日:25.06.2026
説明
Multisensor Coordinate Measuring Machine O-Inspect
O-Inspect O-I 442
Measuring range: X = 400 mm, Y = 400 mm, Z = 200 mm
Length measuring deviation according to ISO 10360-2
with VAST XXT:
MPE_E = (1.9 + L/250) µm,
MPE_P = 1.9 µm
Scanning performance according to ISO 10360-4 with VAST XXT:
MPE_THP = 3.5 µm in 68 s
Length measuring deviation according to VDI/VDE 2617 Sheet 6.1
for Discovery Zoom objective:
MPE_E2D(OT) = (1.9 + L/250) µm
Permissible temperature range for specifications: 19–21 °C
Machine features, equipment:
Bwedszg Ef Nspfx Al Det
Gantry-type measuring machine with a moving machine table
Table height approx. 850 mm
Path measuring system, 0.1 µm resolution
Integrated vibration damping
PC-based scanning control (ISC) integrated
Prepared for optical camera system Discovery Zoom sensor and tactile scanning probe VAST
XXT TL1
Integrated through-light system
Numerical control panel, standard with rotatable tray
Calibration sphere D = 25 mm
Calibration ring
Regularly calibrated by ZEISS
Last calibration: April 2025
Complete calibration history available
Comprehensive accessory package including VAST XXT TL1, Discovery Zoom
sensor, RT-OI Horizontal Complete, grid plate, glass frame, and Calypso software
Original ZEISS documentation available
The machine has been regularly calibrated and inspected by ZEISS. Corresponding calibration protocols are available.
Calibrations performed:
October 2009
November 2011
November 2013
January 2015
January 2016
January 2017
January 2018
February 2019
January 2020
March 2022
April 2023
April 2025
Note:
The regular calibrations by ZEISS document the continuous maintenance and proper operation of the measuring system. The corresponding calibration protocols can be made available for review upon serious purchase interest.
この広告は自動翻訳されています。翻訳ミスがある可能性があります。
O-Inspect O-I 442
Measuring range: X = 400 mm, Y = 400 mm, Z = 200 mm
Length measuring deviation according to ISO 10360-2
with VAST XXT:
MPE_E = (1.9 + L/250) µm,
MPE_P = 1.9 µm
Scanning performance according to ISO 10360-4 with VAST XXT:
MPE_THP = 3.5 µm in 68 s
Length measuring deviation according to VDI/VDE 2617 Sheet 6.1
for Discovery Zoom objective:
MPE_E2D(OT) = (1.9 + L/250) µm
Permissible temperature range for specifications: 19–21 °C
Machine features, equipment:
Bwedszg Ef Nspfx Al Det
Gantry-type measuring machine with a moving machine table
Table height approx. 850 mm
Path measuring system, 0.1 µm resolution
Integrated vibration damping
PC-based scanning control (ISC) integrated
Prepared for optical camera system Discovery Zoom sensor and tactile scanning probe VAST
XXT TL1
Integrated through-light system
Numerical control panel, standard with rotatable tray
Calibration sphere D = 25 mm
Calibration ring
Regularly calibrated by ZEISS
Last calibration: April 2025
Complete calibration history available
Comprehensive accessory package including VAST XXT TL1, Discovery Zoom
sensor, RT-OI Horizontal Complete, grid plate, glass frame, and Calypso software
Original ZEISS documentation available
The machine has been regularly calibrated and inspected by ZEISS. Corresponding calibration protocols are available.
Calibrations performed:
October 2009
November 2011
November 2013
January 2015
January 2016
January 2017
January 2018
February 2019
January 2020
March 2022
April 2023
April 2025
Note:
The regular calibrations by ZEISS document the continuous maintenance and proper operation of the measuring system. The corresponding calibration protocols can be made available for review upon serious purchase interest.
この広告は自動翻訳されています。翻訳ミスがある可能性があります。
提供者
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登録日: 2026
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